Modeling, Design, and Verification for the Analog Front-end of a MEMS-based Parallel Scanning-probe Storage Device

The paper presents an integrated analog front-end (AFE) for the read-channel of a parallel scanning-probe storage device. The read/write element is based on an array of microfabricated silicon cantilevers equipped with heating elements to form nanometer-sized indentations in a polymer surface using integral atomic-force microscopy (AFM) tips. A detailed model based on a combination of a thermal/electrical lumped-element model and behavioral model of the electrostatic/mechanical part was developed. The behavioral model of the electrostatic/mechanical part is automatically generated from a full finite-element model (FEM). The model is completely implemented in Verilog-A and was used to co-develop the integrated analog front-end circuitry together with the read/write cantilever. The model and the analog front-end were simulated together and the results were experimentally verified. The approach chosen is well suited for system-level simulation and verification/extraction in a design environment based on standard EDA tools