• DocumentCode
    1678066
  • Title

    Diagnosability of Input Output Symbolic Transition Systems

  • Author

    Bourgne, Gauvain ; Dague, Philippe ; Nouioua, Farid ; Rapin, Nicolas

  • Author_Institution
    NII, Tokyo, Japan
  • fYear
    2009
  • Firstpage
    147
  • Lastpage
    154
  • Abstract
    Diagnosability checking of discrete-event systems has been extensively studied in the framework of classical nonsymbolic models such as labeled transition systems. It happens that in practice such models tend to need too much space to be efficiently processed. By opposition, symbolic approaches offer an expressive, easy and concise way to model systems, and checking diagnosability from such symbolic models can benefit from this reduction of space complexity.Indeed, though this will generally translate into time complexity,such a tradeoff is advantageous, as diagnosability checking is something that is usually done at design stage.This is why this paper proposes a theoretical frame work to check diagnosability of input-output symbolic transition systems (IOSTS) by adapting the twin plant approach to the symbolic case and relying on the use of a symbolic model checker. This theoretical work is being currently applied to embedded functions inside a vehicle in the context of an industrial project and a simplified version of this problem will serve as a running example throughout the presentation.
  • Keywords
    computational complexity; discrete event systems; symbol manipulation; testing; discrete-event systems diagnosability checking; embedded function; industrial project; input-output symbolic transition systems diagnosability; labeled transition system; nonsymbolic model; space complexity; twin plant approach; Communication channels; Costs; Discrete event systems; Embedded system; Laboratories; Large scale integration; Model driven engineering; Observability; System testing; Vehicles; Diagnosability checking; Input Output Symbolic Transition Systems; Symbolic Execution.;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advances in System Testing and Validation Lifecycle, 2009. VALID '09. First International Conference on
  • Conference_Location
    Porto
  • Print_ISBN
    978-1-4244-4862-3
  • Electronic_ISBN
    978-0-7695-3774-0
  • Type

    conf

  • DOI
    10.1109/VALID.2009.35
  • Filename
    5279406