DocumentCode
1678127
Title
FPGA-Accelerated Baseband Design and Verification of Broadband MIMO Wireless Systems
Author
Alimohammad, Amirhossein ; Fard, Saeed Fouladi ; Cockburn, Bruce F.
Author_Institution
Ukalta Eng., Edmonton, AB, Canada
fYear
2009
Firstpage
135
Lastpage
140
Abstract
The design of communication systems has become more challenging as product complexity and cost pressures have increased and time-to-market has shortened more than ever before. Performance verification of the physical layer (PHY) of wireless communication networks under various radio propagation conditions is a computationally-daunting process. Bit-true software-based simulation of the PHY layer on workstations is becoming prohibitively time-consuming. This makes hardware-accelerated prototyping and verification of the PHY layer an increasingly attractive alternative. This paper presents a bit error rate tester (BERT) for baseband performance verification of multiple antenna (MIMO) systems over accurate radio propagation channel models. This BERT integrates all of the required modules of a typical PHY layer onto a single field-programmable gate array (FPGA). The proposed BERT system significantly decreases the test time compared to conventional software-based verification, hence increasing designer productivity.
Keywords
MIMO communication; antenna arrays; broadband networks; error statistics; field programmable gate arrays; radiowave propagation; wireless channels; BERT system; FPGA-accelerated baseband design; bit error rate tester; bit-true software-based simulation; broadband MIMO wireless system verification; communication system design; multiple antenna systems; multiple input multiple output communication; radio propagation channel models; single field-programmable gate array; software-based verification; the physical layer; wireless communication network; workstations; Baseband; Bit error rate; Costs; Field programmable gate arrays; MIMO; Physical layer; Radio propagation; System testing; Time to market; Wireless communication;
fLanguage
English
Publisher
ieee
Conference_Titel
Advances in System Testing and Validation Lifecycle, 2009. VALID '09. First International Conference on
Conference_Location
Porto
Print_ISBN
978-1-4244-4862-3
Electronic_ISBN
978-0-7695-3774-0
Type
conf
DOI
10.1109/VALID.2009.21
Filename
5279408
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