Title :
FPGA-Accelerated Baseband Design and Verification of Broadband MIMO Wireless Systems
Author :
Alimohammad, Amirhossein ; Fard, Saeed Fouladi ; Cockburn, Bruce F.
Author_Institution :
Ukalta Eng., Edmonton, AB, Canada
Abstract :
The design of communication systems has become more challenging as product complexity and cost pressures have increased and time-to-market has shortened more than ever before. Performance verification of the physical layer (PHY) of wireless communication networks under various radio propagation conditions is a computationally-daunting process. Bit-true software-based simulation of the PHY layer on workstations is becoming prohibitively time-consuming. This makes hardware-accelerated prototyping and verification of the PHY layer an increasingly attractive alternative. This paper presents a bit error rate tester (BERT) for baseband performance verification of multiple antenna (MIMO) systems over accurate radio propagation channel models. This BERT integrates all of the required modules of a typical PHY layer onto a single field-programmable gate array (FPGA). The proposed BERT system significantly decreases the test time compared to conventional software-based verification, hence increasing designer productivity.
Keywords :
MIMO communication; antenna arrays; broadband networks; error statistics; field programmable gate arrays; radiowave propagation; wireless channels; BERT system; FPGA-accelerated baseband design; bit error rate tester; bit-true software-based simulation; broadband MIMO wireless system verification; communication system design; multiple antenna systems; multiple input multiple output communication; radio propagation channel models; single field-programmable gate array; software-based verification; the physical layer; wireless communication network; workstations; Baseband; Bit error rate; Costs; Field programmable gate arrays; MIMO; Physical layer; Radio propagation; System testing; Time to market; Wireless communication;
Conference_Titel :
Advances in System Testing and Validation Lifecycle, 2009. VALID '09. First International Conference on
Conference_Location :
Porto
Print_ISBN :
978-1-4244-4862-3
Electronic_ISBN :
978-0-7695-3774-0
DOI :
10.1109/VALID.2009.21