DocumentCode
1678368
Title
Robustizing circuit optimization using Huber functions
Author
Bandler, John W. ; Chen, S.H. ; Biernacki, R.M. ; Madsen, K. ; Gao, L. ; Yu, H.
Author_Institution
Optimization Syst. Associates Inc., Dundas, Ont., Canada
fYear
1993
Firstpage
1009
Abstract
The authors introduce a novel approach to ´robustizing´ microwave circuit optimization using Huber functions, both two-sided and one-sided. They compare Huber optimization with l/sub 1/, l/sub 2/, and minimax methods in the presence of faults, large and small measurement errors, bad starting points, and statistical uncertainties. They demonstrate FET statistical modeling, multiplexer optimization, analog fault location, and data fitting. They extend the Huber concept by introducing a ´one-sided´ Huber function for large-scale optimization. For large-scale problems, the designer often attempts, by intuition, a preliminary optimization by selecting a small number of dominant variables. It is demonstrated, through multiplexer optimization, that the one-sided Huber function can be more effective and efficient than minimax in overcoming a bad starting point.<>
Keywords
circuit CAD; fault location; functions; optimisation; statistical analysis; FET statistical modeling; Huber functions; analog fault location; circuit optimization; computer aided design; data fitting; large-scale optimization; microwave circuit; multiplexer optimization; Circuit faults; Circuit optimization; Fault location; Large-scale systems; Measurement errors; Microwave FETs; Minimax techniques; Multiplexing; Optimization methods; Robustness;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest, 1993., IEEE MTT-S International
Conference_Location
Atlanta, GA, USA
ISSN
0149-645X
Print_ISBN
0-7803-1209-0
Type
conf
DOI
10.1109/MWSYM.1993.276894
Filename
276894
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