• DocumentCode
    1678368
  • Title

    Robustizing circuit optimization using Huber functions

  • Author

    Bandler, John W. ; Chen, S.H. ; Biernacki, R.M. ; Madsen, K. ; Gao, L. ; Yu, H.

  • Author_Institution
    Optimization Syst. Associates Inc., Dundas, Ont., Canada
  • fYear
    1993
  • Firstpage
    1009
  • Abstract
    The authors introduce a novel approach to ´robustizing´ microwave circuit optimization using Huber functions, both two-sided and one-sided. They compare Huber optimization with l/sub 1/, l/sub 2/, and minimax methods in the presence of faults, large and small measurement errors, bad starting points, and statistical uncertainties. They demonstrate FET statistical modeling, multiplexer optimization, analog fault location, and data fitting. They extend the Huber concept by introducing a ´one-sided´ Huber function for large-scale optimization. For large-scale problems, the designer often attempts, by intuition, a preliminary optimization by selecting a small number of dominant variables. It is demonstrated, through multiplexer optimization, that the one-sided Huber function can be more effective and efficient than minimax in overcoming a bad starting point.<>
  • Keywords
    circuit CAD; fault location; functions; optimisation; statistical analysis; FET statistical modeling; Huber functions; analog fault location; circuit optimization; computer aided design; data fitting; large-scale optimization; microwave circuit; multiplexer optimization; Circuit faults; Circuit optimization; Fault location; Large-scale systems; Measurement errors; Microwave FETs; Minimax techniques; Multiplexing; Optimization methods; Robustness;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 1993., IEEE MTT-S International
  • Conference_Location
    Atlanta, GA, USA
  • ISSN
    0149-645X
  • Print_ISBN
    0-7803-1209-0
  • Type

    conf

  • DOI
    10.1109/MWSYM.1993.276894
  • Filename
    276894