Title :
Robustizing circuit optimization using Huber functions
Author :
Bandler, John W. ; Chen, S.H. ; Biernacki, R.M. ; Madsen, K. ; Gao, L. ; Yu, H.
Author_Institution :
Optimization Syst. Associates Inc., Dundas, Ont., Canada
Abstract :
The authors introduce a novel approach to ´robustizing´ microwave circuit optimization using Huber functions, both two-sided and one-sided. They compare Huber optimization with l/sub 1/, l/sub 2/, and minimax methods in the presence of faults, large and small measurement errors, bad starting points, and statistical uncertainties. They demonstrate FET statistical modeling, multiplexer optimization, analog fault location, and data fitting. They extend the Huber concept by introducing a ´one-sided´ Huber function for large-scale optimization. For large-scale problems, the designer often attempts, by intuition, a preliminary optimization by selecting a small number of dominant variables. It is demonstrated, through multiplexer optimization, that the one-sided Huber function can be more effective and efficient than minimax in overcoming a bad starting point.<>
Keywords :
circuit CAD; fault location; functions; optimisation; statistical analysis; FET statistical modeling; Huber functions; analog fault location; circuit optimization; computer aided design; data fitting; large-scale optimization; microwave circuit; multiplexer optimization; Circuit faults; Circuit optimization; Fault location; Large-scale systems; Measurement errors; Microwave FETs; Minimax techniques; Multiplexing; Optimization methods; Robustness;
Conference_Titel :
Microwave Symposium Digest, 1993., IEEE MTT-S International
Conference_Location :
Atlanta, GA, USA
Print_ISBN :
0-7803-1209-0
DOI :
10.1109/MWSYM.1993.276894