DocumentCode
1678492
Title
When does it make C to give up physical test access?
Author
Greene, Dlavid A.
Author_Institution
AT&T Global Inf. Solutions, West Columbia, SC, USA
fYear
34608
Firstpage
111
Lastpage
119
Abstract
As conventional board designs continue to decrease in size, the cost of “test” is rising proportionally relative to physical, bed-of-nails access. The purpose of this paper is to provide a generalized framework by which users can more quantitatively analyze the costs and benefits of removing physical test access from conventional, surface mount technology (SMT) boards for the purpose of bed-of-nails testing
Keywords
built-in self test; economics; integrated circuit testing; printed circuit testing; surface mount technology; BIST; SMT; bed-of-nails access; bed-of-nails testing; benefits; board designs; controllability; costs; in-circuit test; observability; physical test access; production testing; surface mount technology boards; Circuit testing; Controllability; Cost function; Life testing; Logic circuits; Logic testing; Observability; Packaging; Springs; Surface-mount technology;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1994. Proceedings., International
Conference_Location
Washington, DC
ISSN
1089-3539
Print_ISBN
0-7803-2103-0
Type
conf
DOI
10.1109/TEST.1994.527942
Filename
527942
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