Title :
When does it make C to give up physical test access?
Author :
Greene, Dlavid A.
Author_Institution :
AT&T Global Inf. Solutions, West Columbia, SC, USA
Abstract :
As conventional board designs continue to decrease in size, the cost of “test” is rising proportionally relative to physical, bed-of-nails access. The purpose of this paper is to provide a generalized framework by which users can more quantitatively analyze the costs and benefits of removing physical test access from conventional, surface mount technology (SMT) boards for the purpose of bed-of-nails testing
Keywords :
built-in self test; economics; integrated circuit testing; printed circuit testing; surface mount technology; BIST; SMT; bed-of-nails access; bed-of-nails testing; benefits; board designs; controllability; costs; in-circuit test; observability; physical test access; production testing; surface mount technology boards; Circuit testing; Controllability; Cost function; Life testing; Logic circuits; Logic testing; Observability; Packaging; Springs; Surface-mount technology;
Conference_Titel :
Test Conference, 1994. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-2103-0
DOI :
10.1109/TEST.1994.527942
