Title :
Width Quantization Aware FinFET Circuit Design
Author :
Gu, Jie ; Keane, John ; Sapatnekar, Sachin ; Kim, Chris
Author_Institution :
Minnesota Univ., Minneapolis, MN
Abstract :
This paper presents a statistical leakage estimation method for FinFET devices considering the unique width quantization property. Monte Carlo simulations show that the conventional approach underestimates the average leakage current of FinFET devices by as much as 43% while the proposed approach gives a precise estimation with an error less than 5%. Design example on dynamic logic circuits shows the effectiveness of the proposed method
Keywords :
MOSFET; Monte Carlo methods; logic circuits; logic design; quantisation (signal); semiconductor device models; FinFET devices; Monte Carlo simulations; dynamic logic circuits; leakage current; statistical leakage estimation method; width quantization aware; Circuit synthesis; Design automation; Estimation error; Fabrication; FinFETs; Inverters; Leakage current; Logic circuits; Quantization; Random access memory;
Conference_Titel :
Custom Integrated Circuits Conference, 2006. CICC '06. IEEE
Conference_Location :
San Jose, CA
Print_ISBN :
1-4244-0075-9
Electronic_ISBN :
1-4244-0076-7
DOI :
10.1109/CICC.2006.320916
