Title :
3B21D BIST/Boundary-Scan system diagnostic test story
Author :
Behnke, Edward C.
Author_Institution :
AT&T Bell Labs., Naperville, IL, USA
Abstract :
The 3B21D BIST and Boundary-Scan Design, based on the ANSI/IEEE Std 1149.1-1990, has given the 3B21D System Diagnostic Test Strategy an excellent set of tests at all levels of product assembly
Keywords :
IEEE standards; VLSI; application specific integrated circuits; boundary scan testing; built-in self test; computer architecture; computer testing; fault tolerant computing; production testing; software portability; 3B21D BIST/Boundary-Scan system; 3B21D System Diagnostic Test Strategy; ANSI; IEEE Std 1149.1-1990; board level diagnosis; diagnostic test; multiring configuration; product assembly; signature analysis; single ring configuration; Application specific integrated circuits; Assembly systems; Built-in self-test; Circuit faults; Circuit testing; Hardware; Integrated circuit testing; Logic testing; Printed circuits; System testing;
Conference_Titel :
Test Conference, 1994. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-2103-0
DOI :
10.1109/TEST.1994.527943
