DocumentCode
1678748
Title
3B21D BIST/Boundary-Scan system diagnostic test story
Author
Behnke, Edward C.
Author_Institution
AT&T Bell Labs., Naperville, IL, USA
fYear
34608
Firstpage
120
Lastpage
126
Abstract
The 3B21D BIST and Boundary-Scan Design, based on the ANSI/IEEE Std 1149.1-1990, has given the 3B21D System Diagnostic Test Strategy an excellent set of tests at all levels of product assembly
Keywords
IEEE standards; VLSI; application specific integrated circuits; boundary scan testing; built-in self test; computer architecture; computer testing; fault tolerant computing; production testing; software portability; 3B21D BIST/Boundary-Scan system; 3B21D System Diagnostic Test Strategy; ANSI; IEEE Std 1149.1-1990; board level diagnosis; diagnostic test; multiring configuration; product assembly; signature analysis; single ring configuration; Application specific integrated circuits; Assembly systems; Built-in self-test; Circuit faults; Circuit testing; Hardware; Integrated circuit testing; Logic testing; Printed circuits; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1994. Proceedings., International
Conference_Location
Washington, DC
ISSN
1089-3539
Print_ISBN
0-7803-2103-0
Type
conf
DOI
10.1109/TEST.1994.527943
Filename
527943
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