DocumentCode :
1679301
Title :
A Scalable ET2RAM (SETRAM) with Verify Control for SoC Platform Memory IP on SOI
Author :
Arimoto, Kazutami ; Morishita, Fukashi ; Hayashi, Isamu ; Tanizaki, Tetsushi ; Ipposhi, Takashi ; Dosaka, Katsumi
Author_Institution :
Syst. Core Technol. Div., Renesas Technol. Corp., Itami
fYear :
2006
Firstpage :
429
Lastpage :
432
Abstract :
We had reported TTRAM (Morishita, 2005) and ET2RAM (Arimoto, 2006) which are high-density capacitor-less SOI-CMOS compatible memory IP´s. A platform design methodology becomes the main stream in SoC world because the system integration progress and complexity requires the implementation of many lands of IP´s and induces the longer design turn around time and design cost up. This time, we have up-graded ET2RAM with scalable function named SETRAM (scalable enhanced twin-transistor RAM). This memory IP can be applied to the many kinds of applications by the verify control technique with compact ABC (automatic body control) sense amplifier. The scalable functions are, for example, 263MHz high speed random cycle memory to replace the high density on chip SRAM, 79mW/4Mb lower active power dissipation for mobile application, 453MHz data transfer of page/burst mode for cache memory and graphics memory applications and lower stand-by current mode of 5 sec data retention time. These are also supported as the programmable functions. The SETRAM can provide the scalable memory IP´s in SoC platform on SOI devices and can improve the performance of many future applications
Keywords :
CMOS integrated circuits; memory architecture; random-access storage; silicon-on-insulator; system-on-chip; 263 MHz; 4 Mbit; 453 MHz; 5 sec; 79 mW; SETRAM; SoC platform memory IP; automatic body control sense amplifier; cache memory; capacitorless SOI-CMOS compatible memory IP; graphics memory; platform design methodology; programmable functions; scalable ET2RAM; scalable enhanced twin-transistor RAM; scalable functions; system integration progress; verify control technique; Automatic control; Capacitive sensors; Circuits; Control systems; Costs; Design methodology; Design optimization; Leakage current; Random access memory; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Custom Integrated Circuits Conference, 2006. CICC '06. IEEE
Conference_Location :
San Jose, CA
Print_ISBN :
1-4244-0075-9
Electronic_ISBN :
1-4244-0076-7
Type :
conf
DOI :
10.1109/CICC.2006.321008
Filename :
4114995
Link To Document :
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