Title :
Low Cost Test of High Bandwidth Embedded Memories
Author :
Gorman, Kevin W. ; Anand, Darren ; Pomichter, Gary ; Corbin, William R.
Author_Institution :
IBM Syst. & Technol. Group, Essex Junction, VT
Abstract :
This work presents architectures and methods necessary for providing efficient and thorough test of high bandwidth embedded memories using low speed ATE. Details are also provided on the techniques used to minimize test related silicon area and test time requirements. This combination of flexible at-speed test with minimal circuitry and ATE requirements, and reduced time under test, leads to lower cost production of embedded memories
Keywords :
DRAM chips; automatic test equipment; built-in self test; embedded systems; DRAM chips; automatic test equipment; built-in self test; embedded memories; Bandwidth; Built-in self-test; Circuit testing; Clocks; Costs; Logic testing; Random access memory; Silicon; System testing; Tiles;
Conference_Titel :
Custom Integrated Circuits Conference, 2006. CICC '06. IEEE
Conference_Location :
San Jose, CA
Print_ISBN :
1-4244-0075-9
Electronic_ISBN :
1-4244-0076-7
DOI :
10.1109/CICC.2006.320820
