Title :
Investigation Of The Hollow Cavity Effects On The Breakdown Voltage Characteristic Of A-single-gap Pseudospark Device
Author :
Rhee, M.J. ; Liu, C.J.
Author_Institution :
University of Maryland
Keywords :
Breakdown voltage; Electromagnetic fields; Electromagnetic modeling; Electrons; Fault location; Numerical models; Partial discharges; Plasma applications; Plasma simulation; Plasma sources;
Conference_Titel :
Plasma Science, 1994. Conference Record - Abstracts., 1994 IEEE International Conference on
Conference_Location :
Santa Fe, NM, USA
Print_ISBN :
0-7803-2006-9
DOI :
10.1109/PLASMA.1994.588711
