Title :
Third-order optical nonlinearity in Bulk nanoporous silicon at telecom wavelengths
Author :
Suess, Ryan J. ; Murphy, Thomas E.
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Maryland, College Park, MD, USA
Abstract :
Nonlinear absorption and refraction coefficients of nanoporous silicon are reported and found to be enhanced compared to those of crystalline silicon. A pump-probe measurement showing the temporal character of the nonlinearity is also presented.
Keywords :
elemental semiconductors; nanoporous materials; nonlinear optics; optical pumping; refraction; silicon; Si; bulk nanoporous silicon; nonlinear absorption; pump-probe measurement; refraction coefficients; telecom wavelengths; third-order optical nonlinearity; Absorption; Nonlinear optics; Optical pumping; Optical refraction; Silicon; Wavelength measurement;
Conference_Titel :
Lasers and Electro-Optics (CLEO), 2012 Conference on
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4673-1839-6
