Title :
QTAG: a standard for test fixture based IDDQ/ISSQ monitors
Author_Institution :
Philips Res. Lab., Eindhoven, Netherlands
Abstract :
This paper describes the goals and history of the Quality Test Action Group (QTAG) since if was formed at the 1993 International Test Conference. QTAG was created to provide the industry with a de-facto standard for IDDQ/ISSQ monitors on test fixtures for production testing of CMOS ICs. The group was needed because informal discussions between the semiconductor test departments and the ATE vendors over the past decade had failed to generate the ATE based I DDQ test instrumentation needed by the semiconductor industry
Keywords :
CMOS integrated circuits; automatic test equipment; automatic testing; electric current measurement; integrated circuit testing; measurement standards; production testing; ATE vendors; CMOS ICs; IDDQ/ISSQ monitors; QTAG; Quality Test Action Group; production testing; semiconductor industry; semiconductor test departments; test fixture; Controllability; Fixtures; Integrated circuit modeling; Integrated circuit testing; Laboratories; Observability; Semiconductor device modeling; Semiconductor device testing; System testing; Very large scale integration;
Conference_Titel :
Test Conference, 1994. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-2103-0
DOI :
10.1109/TEST.1994.527950
