Full-wave analysis of multiple lossy microstrip lines on multilayered bi-anisotropic substrates and imperfect ground metallization

An extended spectral-domain immittance approach is used to analyze multiconductor systems on layered bianisotropic substrates. Apart from the losses of the bianisotropic layers, the method takes into account the metallization thickness and losses of both the ground metallization and the multiconductor system, which can consist of conventional or high-T/sub C/ superconductors. It is demonstrated that, due to the order, permittivity, and anisotropy of substrate layers, the propagation characteristics of a multiconductor system can be influenced to obtain a frequency range of almost identical complex propagation constants for all fundamental modes involved. Such behavior can be advantageously utilized in future applications of high-speed interconnects and high-directivity couplers. Since the algorithm is CPU (central processing unit)-time efficient and operational on modern workstations, the model developed offers an attractive solution for modern MMIC (monolithic microwave integrated circuit) design purposes.<>