Title :
High speed optical detectors for monolithic millimeter wave integrated circuits
Author :
Litvin, K. ; Burm, J. ; Woodard, D. ; Schaff, W. ; Eastman, L.F.
Author_Institution :
Sch. of Electr. Eng., Cornell Univ., Ithaca, NY, USA
Abstract :
Metal-semiconductor-metal photodiodes with interdigitated Schottky barrier fingers are being developed for applications in monolithic optical receiver circuits with the purpose of detecting millimeter-wave modulation signals being transmitted via an optical carrier. The devices are planar and incorporate submicron finger spacings and a thin absorption region for speed with a buried stack of tuned Bragg reflectors for enhanced sensitivity at the carrier wavelength. These devices are being integrated with short-gate MODFET (modulation-doped field-effect transistor) amplifiers to form the complete monolithic integrated optical receiver circuit. Device measurements indicate a top surface reflectance of 0.5% with an operation bandwidth in excess of 40 GHz and a dynamic range of 33 dB.<>
Keywords :
MMIC; high electron mobility transistors; metal-semiconductor-metal structures; optical receivers; photodiodes; MSM photodiodes; absorption region; buried stack; interdigitated Schottky barrier fingers; millimeter-wave modulation signals; monolithic millimeter wave integrated circuits; operation bandwidth; optical carrier; optical detectors; sensitivity; short-gate MODFET; submicron finger spacings; top surface reflectance; tuned Bragg reflectors; Fingers; MIMICs; MODFET circuits; Millimeter wave integrated circuits; Millimeter wave transistors; Optical detectors; Optical receivers; Photodiodes; Schottky barriers; Signal detection;
Conference_Titel :
Microwave Symposium Digest, 1993., IEEE MTT-S International
Conference_Location :
Atlanta, GA, USA
Print_ISBN :
0-7803-1209-0
DOI :
10.1109/MWSYM.1993.277049