Title :
Infrared automatic mass screening (IRAMS): an ATE solution
Author :
Chandler, Thomas L. ; Fredrickson, Cynthia A.
Author_Institution :
Div. of Adv. Technol., Sacramento Army Depot, CA, USA
Abstract :
A method of board test which implements infrared automated mass screening (IRAMS) is proposed. This technique bypasses the diagnostics portion of the repair cycle and using IRAMS to quickly screen circuit board and perform fault detection. The go-chain is needed only as a quality inspection tool. Therefore, by eliminating diagnostics, IRAMS can greatly reduce the overall cost of developing and maintaining a test program set
Keywords :
automatic test equipment; automatic testing; fault location; infrared imaging; military equipment; printed circuit testing; Air Force; Army; IR; PCB testing; cost; fault detection; infrared automated mass screening; military equipment ATE; quality inspection; repair depot; test program set; Automatic testing; Circuit faults; Circuit testing; Costs; Electrical fault detection; Electronic equipment testing; Fault detection; Infrared detectors; Printed circuits; Test equipment;
Conference_Titel :
AUTOTESTCON '88. IEEE International Automatic Testing Conference, Futuretest. Symposium Proceedings
Conference_Location :
Minneapolis, MN
DOI :
10.1109/AUTEST.1988.9585
