• DocumentCode
    1680901
  • Title

    Development of a class 1 QTAG monitor

  • Author

    Baker, K. ; Bratt, A. ; Richardson, A. ; Welbers, A.

  • Author_Institution
    Philips Res. Lab., Eindhoven, Netherlands
  • fYear
    34608
  • Firstpage
    213
  • Lastpage
    222
  • Abstract
    This paper describes the development by the authors of an IDDQ monitor for test fixtures based on the provisional QTAG (Quality Test Action Group) standard. The monitor design project is a proof of concept study for the most demanding class 1 type current monitors defined by QTAG. In the paper the historical background to Philips´ support for QTAG is outlined and why the company believes that monitors on test fixtures are currently more practical for many applications than either on-chip IDDQ monitors or ATE based measurement systems
  • Keywords
    CMOS integrated circuits; automatic test equipment; automatic testing; electric current measurement; integrated circuit testing; ATE; CMOS IC testing; IDDQ monitor; Philips; Quality Test Action Group; VLSI; class 1 QTAG monitor; interface; on-chip IDDQ monitors; standard; test fixtures; CMOS integrated circuits; CMOS process; Instruments; Integrated circuit testing; Logic testing; Monitoring; Production; Semiconductor device testing; System testing; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1994. Proceedings., International
  • Conference_Location
    Washington, DC
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-2103-0
  • Type

    conf

  • DOI
    10.1109/TEST.1994.527952
  • Filename
    527952
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1680901