Title :
Development of a class 1 QTAG monitor
Author :
Baker, K. ; Bratt, A. ; Richardson, A. ; Welbers, A.
Author_Institution :
Philips Res. Lab., Eindhoven, Netherlands
Abstract :
This paper describes the development by the authors of an IDDQ monitor for test fixtures based on the provisional QTAG (Quality Test Action Group) standard. The monitor design project is a proof of concept study for the most demanding class 1 type current monitors defined by QTAG. In the paper the historical background to Philips´ support for QTAG is outlined and why the company believes that monitors on test fixtures are currently more practical for many applications than either on-chip IDDQ monitors or ATE based measurement systems
Keywords :
CMOS integrated circuits; automatic test equipment; automatic testing; electric current measurement; integrated circuit testing; ATE; CMOS IC testing; IDDQ monitor; Philips; Quality Test Action Group; VLSI; class 1 QTAG monitor; interface; on-chip IDDQ monitors; standard; test fixtures; CMOS integrated circuits; CMOS process; Instruments; Integrated circuit testing; Logic testing; Monitoring; Production; Semiconductor device testing; System testing; Very large scale integration;
Conference_Titel :
Test Conference, 1994. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-2103-0
DOI :
10.1109/TEST.1994.527952
