DocumentCode :
1680958
Title :
A TOC combining ACO sequencing method for the semiconductor manufacturing fabrication
Author :
Li, Li ; Gu, Pan ; Qiao, Fei ; Wu, Ying
Author_Institution :
Sch. of Electron. & Inf. Eng., Tongji Univ., Shanghai, China
fYear :
2010
Firstpage :
4602
Lastpage :
4607
Abstract :
Based on the analysis on the scheduling characteristics of the semiconductor manufacturing fabrication lines, we propose a TOC(Theory-of-Constraints) combining ACO(Ant Colony Optimization) sequencing method. The method firstly determines the bottlenecks of a semiconductor manufacturing fabrication line, and then applies an ACO algorithm to obtain the optimized jobs processing priority sequence of the bottlenecks, which is the constraint to deduce the jobs processing priority sequence of other non-bottleneck areas. A simplified semiconductor wafer fabrication line model(Mini-fab) is used to verify and validate the proposed method. The simulation results show that the proposed method is superior to the common scheduling rules (such as FIFO, EDD and CR), with the ability to obtain an optimized scheduling solution in a reasonable time.
Keywords :
constraint theory; flow production systems; job shop scheduling; optimisation; semiconductor device manufacture; ACO sequencing method; TOC; ant colony optimization; fabrication lines scheduling; jobs processing priority sequence; semiconductor manufacturing fabrication; semiconductor wafer fabrication line; theory-of-constraints; Chromium; Distributed Bragg reflectors; Fabrication; Job shop scheduling; Optimization; Simulation; ACO; TOC; bottlenecks; scheduling; semiconductor manufacturing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Intelligent Control and Automation (WCICA), 2010 8th World Congress on
Conference_Location :
Jinan
Print_ISBN :
978-1-4244-6712-9
Type :
conf
DOI :
10.1109/WCICA.2010.5554196
Filename :
5554196
Link To Document :
بازگشت