Title :
An improved diffraction tomography for imaging of high-contrast dielectric objects
Author :
Suh, K.-W. ; Kim, S.-Y. ; Ra, J.-W.
Author_Institution :
Samsung Electron., Seoul, South Korea
Abstract :
An improved version of diffraction tomography has been developed for microwave imaging of high-contrast dielectric objects. It consists of three steps. First the spatially sliced projection functions are constructed from frequency-diversity measurement data at a fixed angle. Then the domain of these projection functions is adjusted to the same area of the actual object. After angular-diversity measurements, high-contrast dielectric profiles are reconstructed by backprojecting the modified projection functions. Numerical simulation results are presented. This improved diffraction tomography may lead to the development of a microwave imaging system adapted to biological bodies by removing the limitation of the first-order Born approximation.<>
Keywords :
biological techniques and instruments; computerised tomography; microwave imaging; angular-diversity measurements; backprojecting; biological bodies; diffraction tomography; frequency-diversity measurement data; high-contrast dielectric objects; imaging; microwave imaging; spatially sliced projection functions; Approximation methods; Computed tomography; Dielectric measurements; Diffraction; Frequency measurement; Image reconstruction; Lighting; Microwave imaging; Microwave technology; X-ray scattering;
Conference_Titel :
Microwave Symposium Digest, 1993., IEEE MTT-S International
Conference_Location :
Atlanta, GA, USA
Print_ISBN :
0-7803-1209-0
DOI :
10.1109/MWSYM.1993.277072
