DocumentCode :
1681115
Title :
Power recycler for DC power supplies burn-in test: design and experimentation
Author :
Ayres, Carlos Augusto ; Barbi, Ivo
Author_Institution :
Power Electron. Inst., Federal Univ. of Santa Caterina, Florianopolis, Brazil
Volume :
1
fYear :
1996
Firstpage :
72
Abstract :
Conventionally, the burn-in test of DC power supplies uses resistors as load. Consequently, all the energy involved is lost by heating, provoking still an additional energy waste with the air conditioning system. The power recycler is a power converter that replaces the resistors load banks in the burn-in test of DC power supplies with the advantage that most of the energy is sent back to the utility grid with low THD and quasi-unitary power factor. The economical benefits due to energy savings are evident and contribute in reducing the final cost of the equipment. Besides, the power recycler is totally agreeable to the world concern about ecology and energy conservation. This paper analyses the proposed solutions in recent literature and presents a new architecture for the implementation of a power recycler for DC power supplies burn-in tests. The proposed circuit is regulated by conventional integrated circuits: PWM and power factor controllers. Circuit operation, design characteristics, simulation and experimental results of a 2 kW prototype are provided in the paper
Keywords :
PWM power convertors; circuit testing; energy conservation; load (electric); power supplies to apparatus; power supply circuits; 2 kW; DC power supplies; PWM; burn-in test; energy conservation; energy savings; integrated circuits; power converter load; power factor controllers; power recycler; utility grid; Air conditioning; Circuits; Power generation economics; Power supplies; Power system economics; Pulse width modulation; Reactive power; Resistors; Testing; Waste heat;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Applied Power Electronics Conference and Exposition, 1996. APEC '96. Conference Proceedings 1996., Eleventh Annual
Conference_Location :
San Jose, CA
Print_ISBN :
0-7803-3044-7
Type :
conf
DOI :
10.1109/APEC.1996.500425
Filename :
500425
Link To Document :
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