Title :
MLP´s hidden-node saturations and insensitivity to initial weights in two classification benchmark problems: parity and two-spirals
Author :
Mizutani, Eiji ; Dreyfus, Stuart E.
Author_Institution :
Dept. of Comput. Sci., Nat. Tsing Hua Univ., Hsinchu, Taiwan
fDate :
6/24/1905 12:00:00 AM
Abstract :
Two two-class classification benchmarks, the parity problem and the two-spiral problem, are very difficult to solve using a standard single-hidden-layer MLP when trained with an incremental gradient method (i.e., pattern-by-pattern-mode steepest-descent-type algorithm), often called backpropagation (BP) algorithm. We show that the learning capacity of such an incremental-mode MLP with a single hidden layer can be augmented dramatically by careful choice of learning rates with special attention to hidden-node saturation. In particular, using a modified squared error objective function, we shall demonstrate that an MLP with only four hidden nodes can consistently solve the seven-bit parity problem while simultaneously developing an "insensitivity" to parameters initialized in a certain small range. In the two-spiral problem, we show a single hidden-layer MLP optimized with an incremental gradient (or BP) algorithm tends to be attracted by a singular point and explain how to avoid it or solving the problem perfectly. We hope our finding can be further generalized to some other problems in the future
Keywords :
learning (artificial intelligence); multilayer perceptrons; pattern classification; hidden-node saturations; incremental mode; learning capacity; learning rates; modified squared error objective function; multilayer perceptrons; parity problem; two-class classification benchmarks; two-spiral problem; Backpropagation algorithms; Computer science; Gradient methods; Industrial engineering; Jacobian matrices; Least squares methods; Multi-layer neural network; Multilayer perceptrons; Neural networks; Operations research;
Conference_Titel :
Neural Networks, 2002. IJCNN '02. Proceedings of the 2002 International Joint Conference on
Conference_Location :
Honolulu, HI
Print_ISBN :
0-7803-7278-6
DOI :
10.1109/IJCNN.2002.1007597