Title :
A serially addressable, flexible current monitor for test fixture based IDDQ/ISSQ testing
Author_Institution :
Design Autom. Div., Texas Instrum. Inc., Dallas, TX, USA
Abstract :
The Quality Test Action Group (QTAG) was formed at the 1993 International Test Conference to define a standard for test fixture based off-chip quiescent current monitors for use in the production testing of CMOS integrated circuits. These quiescent current monitors will provide the IDDQ/ISSQ test instrumentation that is needed by the semiconductor industry. This paper proposes a standard serial interface to be used by ATE systems to communicate with the QTAG quiescent current monitors
Keywords :
CMOS integrated circuits; automatic test equipment; automatic testing; computerised monitoring; electric current measurement; integrated circuit testing; ATE; CMOS integrated circuits; IDDQ/ISSQ testing; QTAG; Quality Test Action Group; off-chip quiescent current monitors; production testing; semiconductor industry; serially addressable flexible current monitor; standard serial interface; test fixture; test instrumentation; CMOS integrated circuits; Circuit testing; Communication standards; Electronics industry; Fixtures; Instruments; Integrated circuit testing; Monitoring; Production; Semiconductor device testing;
Conference_Titel :
Test Conference, 1994. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-2103-0
DOI :
10.1109/TEST.1994.527953
