DocumentCode
1681244
Title
A serially addressable, flexible current monitor for test fixture based IDDQ/ISSQ testing
Author
Hales, Alan
Author_Institution
Design Autom. Div., Texas Instrum. Inc., Dallas, TX, USA
fYear
34608
Firstpage
223
Lastpage
232
Abstract
The Quality Test Action Group (QTAG) was formed at the 1993 International Test Conference to define a standard for test fixture based off-chip quiescent current monitors for use in the production testing of CMOS integrated circuits. These quiescent current monitors will provide the IDDQ/ISSQ test instrumentation that is needed by the semiconductor industry. This paper proposes a standard serial interface to be used by ATE systems to communicate with the QTAG quiescent current monitors
Keywords
CMOS integrated circuits; automatic test equipment; automatic testing; computerised monitoring; electric current measurement; integrated circuit testing; ATE; CMOS integrated circuits; IDDQ/ISSQ testing; QTAG; Quality Test Action Group; off-chip quiescent current monitors; production testing; semiconductor industry; serially addressable flexible current monitor; standard serial interface; test fixture; test instrumentation; CMOS integrated circuits; Circuit testing; Communication standards; Electronics industry; Fixtures; Instruments; Integrated circuit testing; Monitoring; Production; Semiconductor device testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1994. Proceedings., International
Conference_Location
Washington, DC
ISSN
1089-3539
Print_ISBN
0-7803-2103-0
Type
conf
DOI
10.1109/TEST.1994.527953
Filename
527953
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