Title :
Microwave measurements of high Tc superconductors
Author :
Farber, Eli ; Deutscher, G. ; Koren, G. ; Jerby, E.
Author_Institution :
Sch. of Phys. & Astron., Tel Aviv Univ., Israel
Abstract :
The parallel plate resonator has been used for measuring high Tc superconductors. This method is used to measure superconducting c-axis oriented YBa2Cu3O7-δ ~1 cm2 thin films. These ~1 cm2 films were grown by two methods: pulsed laser deposition and DC sputtering. Using this method a high resolution surface resistance is calculated directly from the measured unloaded quality factor. The method provides relatively accurate and sensitive measurements of the penetration depth. The change in the penetration depth at the low temperature range reflects the superconducting microscopic state. The parallel-plate resonator method has a resolution of a few Å in the penetration depth measurements
Keywords :
Q-factor measurement; barium compounds; copper compounds; high-temperature superconductors; microwave measurement; penetration depth (superconductivity); pulsed laser deposition; sputter deposition; superconducting cavity resonators; superconducting thin films; surface conductivity; yttrium compounds; DC sputtering; YBa2Cu3O7-δ; YBa2Cu3O7; high Tc superconductors; high resolution surface resistance; low temperature range; measured unloaded quality factor; microwave measurements; parallel plate resonator; penetration depth measurement; pulsed laser deposition; superconducting microscopic state; superconducting thin films; Electrical resistance measurement; High temperature superconductors; Microwave measurements; Optical pulses; Pulsed laser deposition; Sputtering; Superconducting films; Superconducting microwave devices; Superconducting thin films; Surface resistance;
Conference_Titel :
Electrical and Electronics Engineers in Israel, 1996., Nineteenth Convention of
Conference_Location :
Jerusalem
Print_ISBN :
0-7803-3330-6
DOI :
10.1109/EEIS.1996.567011
