Title :
Coupling phenomena in conductor-back slotline structures
Author :
Liu, Y. ; Hirota, T. ; Itoh, T.
Author_Institution :
Dept. of Electr. Eng., California Univ., Los Angeles, CA, USA
Abstract :
Leakage phenomena possible in conductor-backed slotlines are investigated through an analysis of coupled slotlines for possible application to a nonproximity directional coupler. Two coupled slotlines with finite width of the conductor backing are analyzed using the spectral domain method. The propagation constants and experimental results obtained confirm that coupling is caused by leakage through the conductor backing. It is shown that the slotlines couple with each other even if they are physically separated by a large distance. The coupling phenomena were confirmed through an experiment on forward-coupling directional couplers. It was found possible to prevent the leakage by adding an additional top layer.<>
Keywords :
directional couplers; spectral analysis; conductor-back slotline structures; coupled slotlines; forward-coupling directional couplers; leakage; nonproximity directional coupler; propagation constants; spectral domain method; Conductors; Coplanar waveguides; Dielectric constant; Dielectric substrates; Directional couplers; Frequency; Microstrip; Radio communication; Slotline; Strips;
Conference_Titel :
Microwave Symposium Digest, 1993., IEEE MTT-S International
Conference_Location :
Atlanta, GA, USA
Print_ISBN :
0-7803-1209-0
DOI :
10.1109/MWSYM.1993.277087