Title :
On the initialization of sequential circuits
Author :
Wahbeh, J.A. ; Saab, Daniel G.
Author_Institution :
IBM Corp., Hopewell Junction, NY, USA
Abstract :
A general method for determining whether a certain design is initializable, and for generating its initialization sequence, is presented. This method is based on structural decomposition of the circuit, and can handle both logical (using X-value simulation) and functional initializabilities. Results for some benchmark circuits are also presented
Keywords :
fault diagnosis; logic partitioning; logic testing; sequential circuits; X-value simulation; functional initializabilities; initialization; sequential circuits; structural decomposition; Automata; Automatic test pattern generation; Circuit simulation; Computational modeling; Equations; Flip-flops; Hardware; High performance computing; Multivalued logic; Sequential circuits;
Conference_Titel :
Test Conference, 1994. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-2103-0
DOI :
10.1109/TEST.1994.527954
