Title :
A systematic error analysis of HP 8510 time-domain gating techniques with experimental verification
Author :
Lu, K. ; Brazil, T.J.
Author_Institution :
Dept. of Eletron. & Electr. Eng., Univ. Coll. Dublin, Ireland
Abstract :
The errors caused by using time-domain gating techniques on the HP 8510 automatic network analyzer are investigated systematically. These errors are divided into four categories: out-of-gate attenuation error, truncation error, masking error, and multireflection aliasing error. A method for estimating the order of the magnitude errors resulting from time-domain gating is presented. Experiments for supporting the analysis have been designed and carried out, giving results in good agreement with theory.<>
Keywords :
error analysis; measurement errors; microwave measurement; network analysers; ANA; HP 8510; automatic network analyzer; error analysis; magnitude errors; masking error; multireflection aliasing error; out-of-gate attenuation error; time-domain gating techniques; truncation error; Attenuation; Distortion measurement; Educational institutions; Error analysis; Finite wordlength effects; Frequency measurement; Reflection; Time domain analysis; Transmission line discontinuities; Transmission line measurements;
Conference_Titel :
Microwave Symposium Digest, 1993., IEEE MTT-S International
Conference_Location :
Atlanta, GA, USA
Print_ISBN :
0-7803-1209-0
DOI :
10.1109/MWSYM.1993.277102
