Title :
A sense amplifier based circuit for concurrent detection of soft and timing errors in CMOS ICs
Author :
Tsiatouhas, Y. ; Matakias, S. ; Arapoyanni, A. ; Haniotakis, Th
Author_Institution :
Comput. Sci. Dept., Ioannina Univ., Greece
Abstract :
We propose a new concurrent soft and timing error detection circuit that exploits the time redundancy approach to achieve tolerance with respect to transient and delay faults. The idea is based on current mode sense amplifier topologies to provide fast error detection times.
Keywords :
CMOS integrated circuits; amplifiers; concurrent engineering; error detection; integrated circuit testing; redundancy; timing circuits; CMOS IC; concurrent detection; current mode sense amplifier topologies; delay faults tolerance; error detection; monitoring circuit; sense amplifier based circuit; soft error; time redundancy approach; timing errors; transient error tolerance; Circuit faults; Circuit testing; Clocks; Computer errors; Costs; Delay; Electrical fault detection; Frequency; Redundancy; Timing;
Conference_Titel :
On-Line Testing Symposium, 2003. IOLTS 2003. 9th IEEE
Print_ISBN :
0-7695-1968-7
DOI :
10.1109/OLT.2003.1214360
