DocumentCode :
1681792
Title :
A circuit simulation model for high-power high-speed GaAs Schottky diodes
Author :
Pendharkar, S. ; Shenai, K.
Author_Institution :
Dept. of Electr. & Comput. Eng., Wisconsin Univ., Madison, WI, USA
Volume :
1
fYear :
1996
Firstpage :
246
Abstract :
This paper proposes a physically-based behavioral circuit simulation model for high-power GaAs Schottky diodes which is valid over all regions of operation. No conditional statements are needed to define the regions of operation. A new and more accurate method of obtaining depletion capacitance model parameters from the measured capacitance values is proposed. A simple current and temperature dependent resistance model is used to model the nonlinear diode resistance as well as the contact and packaging resistance. The validity of the model is demonstrated under various DC and transient switching conditions. Simulation results are compared with experimental data obtained from 200 V GaAs Schottky diodes. The diode model is tested at various temperatures in different test circuits and the simulation results are shown to be in excellent agreement with the measured data under both hard- and soft-switching conditions. The model is implemented in SABER, an advanced behavioral circuit simulator, but it can easily be implemented in other circuit simulators which have user defined mathematical equations
Keywords :
III-V semiconductors; Schottky diodes; circuit analysis computing; gallium arsenide; power engineering computing; power semiconductor diodes; power semiconductor switches; semiconductor device models; software packages; switching circuits; 200 V; DC switching conditions; GaAs; SABER; behavioral circuit simulation model; depletion capacitance model parameters; hard-switching; nonlinear diode resistance model; operation regions; power Schottky diodes; soft-switching; transient switching conditions; user defined mathematical equations; Capacitance measurement; Circuit simulation; Circuit testing; Contact resistance; Electrical resistance measurement; Gallium arsenide; Mathematical model; Packaging; Schottky diodes; Temperature dependence;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Applied Power Electronics Conference and Exposition, 1996. APEC '96. Conference Proceedings 1996., Eleventh Annual
Conference_Location :
San Jose, CA
Print_ISBN :
0-7803-3044-7
Type :
conf
DOI :
10.1109/APEC.1996.500450
Filename :
500450
Link To Document :
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