Title :
Optimum MIMO-OFDM Receivers with Imperfect Channel State Information
Author :
Coluccia, Giulio ; Riegler, XErwin ; Mecklenbrauker, Christoph ; Taricco, Giorgio
Author_Institution :
Politec. di Torino, Turin
Abstract :
Channel estimation inaccuracy is known to affect significantly the error performance of coded communication systems. This applies in particular to broadband MIMO channels, often considered in conjunction with OFDM such as in the IEEE 802.11n and 802.16 standards. The focus of this work is on an 802.11n compliant MIMO-OFDM communication system. Different channel estimation techniques (based on pilot symbol insertion) are considered and their relevant error performance is analyzed. More specifically, genie-aided, mismatched, and optimum channel estimation techniques are studied with special emphasis on the last one as far as concerns the relative error performance versus complexity trade-off in suboptimum implementation. It is shown that the optimum receiver can be implemented by limiting the channel processing to the dominant eigenmodes, in order to reduce the ensuing complexity. The approach followed in this work may be seen as an extension of previous results relevant to the narrowband MIMO channel.
Keywords :
IEEE standards; MIMO communication; OFDM modulation; channel estimation; communication complexity; eigenvalues and eigenfunctions; error analysis; radio receivers; wireless LAN; IEEE 802.11n standards; IEEE 802.16 standards; MIMO-OFDM communication system; MIMO-OFDM receivers; broadband MIMO channels; channel estimation techniques; channel processing; channel state information; coded communication systems; communication complexity; dominant eigenmodes; error performance; narrowband MIMO channel; optimum receiver; pilot symbol insertion; Channel estimation; Channel state information; Covariance matrix; Decoding; Fading; MIMO; Narrowband; Receiving antennas; Rician channels; Transmitters;
Conference_Titel :
Global Telecommunications Conference, 2008. IEEE GLOBECOM 2008. IEEE
Conference_Location :
New Orleans, LO
Print_ISBN :
978-1-4244-2324-8
DOI :
10.1109/GLOCOM.2008.ECP.642