Title :
Crosstalk Reduction with Nonlinear Transmission Lines for High-Speed VLSI System
Author :
Kim, Jinsook ; Ni, Weiping ; Kan, Edwin C.
Author_Institution :
Sch. of Electr. & Comput. Eng., Cornell Univ., Ithaca, NY
Abstract :
We report efficient crosstalk and signal reflection reduction with nonlinear transmission lines (NLTLs) for high-speed VLSI. Crosstalk measurements of NLTLs implemented with the Lincoln Lab 0.18mum FDSOI (fully-depleted silicon-on-insulator) CMOS process are performed in time domain as well as by S-parameters up to 25GHz. The excellent suppression capabilities on signal reflection, data-dependent timing errors and crosstalk without any circuit overheads in a broadband illustrate the advantage of the NLTL global interconnect
Keywords :
CMOS integrated circuits; S-parameters; VLSI; crosstalk; integrated circuit noise; interference suppression; silicon-on-insulator; transmission lines; 0.18 micron; CMOS process; FDSOI; S-parameters; crosstalk measurements; crosstalk reduction; data-dependent timing errors; fully-depleted silicon-on-insulator; high-speed VLSI system; nonlinear transmission lines; signal reflection reduction; CMOS process; Crosstalk; Distributed parameter circuits; Performance evaluation; Reflection; Silicon on insulator technology; Time measurement; Transmission line measurements; Transmission lines; Very large scale integration;
Conference_Titel :
Custom Integrated Circuits Conference, 2006. CICC '06. IEEE
Conference_Location :
San Jose, CA
Print_ISBN :
1-4244-0075-9
Electronic_ISBN :
1-4244-0076-7
DOI :
10.1109/CICC.2006.320932
