Title :
Introducing SW-based fault handling mechanisms to cope with EMI in embedded electronics: are they a good remedy?
Author :
Vargas, F. ; Brum, D. ; Prestes, D. ; Bolzani, L. ; Rhod, E. ; Reorda, M.
Author_Institution :
Electr. Eng. Dept., Catholic Univ., Porto Alegre, Brazil
Abstract :
We summarize a study on the effectiveness of two software-based fault handling mechanisms in terms of detecting conducted electromagnetic interference (EMI) in microprocessors. One of these techniques deals with processor control flow checking. The second one is used to detect errors in code variables. In order to check the effectiveness of such techniques in RF ambient, an EIC 61.000-4-29 normative-compliant conducted RF-generator was implemented to inject spurious electromagnetic noise into the supply lines of a commercial off-the-shelf (COTS) microcontroller-based system. Experimental results suggest that the considered techniques present a good effectiveness to detect this type of faults, despite the multiple-fault injection nature of EMI in the processor control and data flows, which in most cases result in a complete system functional loss (the system must be reset).
Keywords :
CMOS digital integrated circuits; electromagnetic interference; embedded systems; fault tolerance; microprocessor chips; CMOS technology; EIC 61.000-4-29 normative-compliant; EMI; IC hardness; IC-level solutions; RF ambient; RF-generator; SW-based fault handling mechanisms; commercial off-the-shelf microcontroller-based system; complete system functional loss; data flows; electromagnetic environment; electromagnetic interference; embedded electronics; errors; microprocessors; multiple-fault injection; processor control flow checking; software-based fault handling mechanisms; spurious electromagnetic noise; CMOS technology; Clocks; Electromagnetic interference; Electromagnetic radiation; Fault detection; Integrated circuit noise; Microprocessors; Process control; Radio frequency; Signal design;
Conference_Titel :
On-Line Testing Symposium, 2003. IOLTS 2003. 9th IEEE
Print_ISBN :
0-7695-1968-7
DOI :
10.1109/OLT.2003.1214389