An evaluation of built-in vs. off-chip strategies for online transient current testing

Author

Alorda, B. ; Segura, J.

Author_Institution

Dept. Fisica, Univ. de les Illes Balears, Palma de Mallorca, Spain

fYear

2003

Firstpage

178

Lastpage

182

Abstract

We evaluate the possibilities of transient current testing practical implementation by comparing the transient supply current signature at the external circuit supply pins to its internal behavior. To do this we develop and analyze a hierarchical power-grid equivalent circuit to evaluate the supply current frequency components and their distribution over the power/ground grid hierarchy. This is a key step to determine the feasibility of on-chip vs. off-chip idd(t) strategies and their successive application to online testing.

Keywords

built-in self test; integrated circuit testing; integrated circuits; logic testing; transient analysis; built-in testing; decoupling capacitor; external circuit supply; ground grid hierarchy; hierarchical power-grid equivalent circuit; off-chip testing; on-chip testing; online testing; power grid hierarchy; supply current frequency component; transient current testing; transient current waveform; transient supply current signature; Circuit testing; Current measurement; Current supplies; Frequency; Integrated circuit testing; Logic testing; Power grids; Power measurement; RLC circuits; Shape measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

On-Line Testing Symposium, 2003. IOLTS 2003. 9th IEEE

Print_ISBN

0-7695-1968-7

Type

conf

DOI

10.1109/OLT.2003.1214395

Filename

1214395