Title :
Perspectives of combining online and offline test technology for dependable systems on a chip
Author :
Galke, Christian ; Grabow, Marcus ; Vierhaus, Heinrich Theodor
Author_Institution :
Comput. Eng. Group, Brandenburg Univ. of Technol. Cottbus, Germany
Abstract :
Silicon IC technology is entering a new stage of development with the arrival of structures below 100 nm. Such devices are volatile to external radiation effects caused by radioactive particles. Hence circuits in safety critical applications must be self-testing and self-correcting. Production test for complex ICs in deep sub-micron technology is also becoming impossible without built-in self test technology. In this paper, we try to analyze in how far self-test technology for production test and for online self test can be combined for reducing the overall overhead for testing.
Keywords :
built-in self test; elemental semiconductors; integrated circuit reliability; integrated circuit testing; logic testing; radiation hardening (electronics); silicon; system-on-chip; 100 nm; Si; SoC test architecture; asynchronous system; built-in self test technology; external radiation effect; integrated circuit; offline test technology; online test technology; radioactive particle; self-correcting; self-test technology; silicon IC technology; sub-micron technology; systems on a chip; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Integrated circuit technology; Integrated circuit testing; Logic devices; Logic testing; Production; System testing;
Conference_Titel :
On-Line Testing Symposium, 2003. IOLTS 2003. 9th IEEE
Print_ISBN :
0-7695-1968-7
DOI :
10.1109/OLT.2003.1214396
