Title :
A methodology for test replacement solutions of obsolete processors
Author :
Velazco, R. ; Anghel, L. ; Saleh, S.
Author_Institution :
TIMA Lab., Grenoble, France
Abstract :
Obsolescence of electronic components is a big concern affecting most electronic equipments involved in safety critical applications (automotive, avionics, airframe, nuclear plants, military applications...). Indeed, such applications are active years longer than was originally anticipated. This paper addresses a methodology to validate emulated replacement solutions and propose solutions to be experienced on a Motorola 6800 processor to illustrate the proposed approach.
Keywords :
integrated circuit reliability; integrated circuit testing; microprocessor chips; timing; FPGA; Motorola 6800 processor; electronic component obsolescence; field programmable gate arrays; obsolete processor; target processor; test replacement solution; Application software; Automotive engineering; Costs; Design engineering; Field programmable gate arrays; Hardware; Microelectronics; Microprocessors; Military computing; Testing;
Conference_Titel :
On-Line Testing Symposium, 2003. IOLTS 2003. 9th IEEE
Print_ISBN :
0-7695-1968-7
DOI :
10.1109/OLT.2003.1214400
