Title :
Retailoring for Fast, On-the-Fly Trace Generation for NoC Design Space Exploitation
Author :
Yu-Chi Chang ; Huang, Yoshi Shih-Chieh ; Tsung-Chan Tsai ; Yuan-Ying Chang ; Chung-Ta King ; Juin-Ming Lu
Abstract :
As the number of cores on a chip increases continuously, network-on-chip (NoC) becomes a critical component in SoC. To exploit the design space of NoC, trace-driven simulation is often used. However, preparing traces of different numbers of cores for design space exploitation can be time-consuming and require huge storage. In this paper, we propose trace retailoring for fast and on-the-fly trace generation. The idea is to transform a seed trace for a certain number of cores to new traces for different number of cores. This is done by representing traces using a concise structure called attack board. Trace retailoring then becomes that of manipulating attack board, which can be used in turn to generate traces on-the-fly during simulations. Our evaluations show that the retail red traces can produce performance results close to real traces, and thus can be used for design space explorations.
Keywords :
integrated circuit design; network-on-chip; NoC design space exploitation; SoC; attack board; concise structure; network-on-chip; on-the-fly trace generation; seed trace; trace retailoring; trace-driven simulation; Computational modeling; Data models; Master-slave; Pipelines; Programming; System-on-chip; Transforms; Network-on-chi; design space exploitation; multicore architecture; trace generation; trace-driven simulation;
Conference_Titel :
Computer, Consumer and Control (IS3C), 2014 International Symposium on
Conference_Location :
Taichung
DOI :
10.1109/IS3C.2014.269