DocumentCode :
1683396
Title :
Dynamic signature analysis using minimum spectral features
Author :
Keit, Tham Heng ; Raveendran, P. ; Takeda, Fumiaki ; Yoshida, Yoshikazu
Author_Institution :
Japan Syst. Dev. Co. Ltd, Tokushima, Japan
Volume :
2
fYear :
2002
fDate :
6/24/1905 12:00:00 AM
Firstpage :
1281
Lastpage :
1286
Abstract :
Presents a technique to classify signatures produced by the pressure exerted on the pen tip. Before the features are extracted, a low-pass filter is designed to remove frequencies greater that 50 Hz. A segmentation method using moving-average filtering and gradient calculation is used to divide the time series data into segments. The autoregressive (AR) coefficients are derived from each segment. From the coefficients, the power spectral density (PSD) is determined for every segment. A genetic algorithm (GA) is used to select the range of frequencies that contains the most important information. The selected range of frequencies is then fed into a multilayer perceptron (MLP) classifier with one hidden layer for verification. A database of 1,000 signatures is used for training and testing. The system is tested for genuine as well as forged signatures. The result obtained showed an average error rate of 3.09-3.33%
Keywords :
autoregressive moving average processes; feature extraction; genetic algorithms; handwriting recognition; low-pass filters; multilayer perceptrons; signal classification; spectral analysis; autoregressive coefficients; dynamic signature analysis; error rate; feature extraction; forged signatures; frequency range selection; genetic algorithm; gradient calculation; hidden layer; low-pass filter; minimum spectral features; moving average filtering; multilayer perceptron classifier; pen tip exerted pressure; power spectral density; signature classification; signature database; signature verification; time series data segmentation method; Data mining; Databases; Feature extraction; Filtering; Frequency conversion; Genetic algorithms; Low pass filters; Multilayer perceptrons; Spectral analysis; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Neural Networks, 2002. IJCNN '02. Proceedings of the 2002 International Joint Conference on
Conference_Location :
Honolulu, HI
ISSN :
1098-7576
Print_ISBN :
0-7803-7278-6
Type :
conf
DOI :
10.1109/IJCNN.2002.1007679
Filename :
1007679
Link To Document :
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