Title :
Modeling and stability analysis of a DC power system with solid state power controllers
Author :
Panov, Y.V. ; Lee, F.C.
Author_Institution :
Bradley Dept. of Electr. Eng., Virginia Polytech. Inst. & State Univ., Blacksburg, VA, USA
Abstract :
A solid state power controller (SSPC) has become a popular element of a large-scale DC power system. An SSPC has a unique capability to limit short term overcurrent through the power device (MOSFET) operation in the active region. The device is controlled by a current feedback loop whose characteristics are shown to be strongly dependent on the SSPC load. The interaction between an SSPC control loop and a load converter can cause the instability, which was observed on the NASA Space Station hardware. The instability origin is revealed by the proposed small-signal SSPC model in the current limiting mode of operation. The MOSFET parasitic capacitances were demonstrated to play a crucial role in the influence of the load impedance on the SSPC dynamic behavior. Several design measures to decrease the SSPC loop sensitivity to the load are recommended. Small-signal analysis results are compared with the experimental data
Keywords :
capacitance; controllers; electric current control; electric impedance; feedback; overcurrent protection; power MOSFET; power control; power convertors; space vehicle power plants; stability; DC power system; NASA Space Station hardware; active region; current feedback loop control; instability; load converter; load impedance; parasitic capacitances; power MOSFET operation; short term overcurrent limiting; small-signal analysis; solid state power controller; stability analysis; Control systems; Large-scale systems; MOSFET circuits; Power MOSFET; Power system analysis computing; Power system modeling; Power system stability; Solid modeling; Solid state circuits; Stability analysis;
Conference_Titel :
Applied Power Electronics Conference and Exposition, 1996. APEC '96. Conference Proceedings 1996., Eleventh Annual
Conference_Location :
San Jose, CA
Print_ISBN :
0-7803-3044-7
DOI :
10.1109/APEC.1996.500514