DocumentCode
1683624
Title
Thermal near-field optical spectroscopy
Author
Jones, Andrew C. ; Raschke, Markus B.
Author_Institution
Dept. of Phys. & Chem., Univ. of Washington, Seattle, WA, USA
fYear
2012
Firstpage
1
Lastpage
2
Abstract
Scattering near-field microscopy with heated tips is used to spectroscopically characterize the spatially and spectrally distinct infrared thermal near-field demonstrating for the first time the resonant enhancement of the underlying electromagnetic local density of states.
Keywords
infrared spectroscopy; distinct infrared thermal near-field; electromagnetic local density; scattering near-field microscopy; thermal near-field optical spectroscopy; Electromagnetics; Heating; Materials; Microscopy; Optical surface waves; Silicon carbide; Tin;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics (CLEO), 2012 Conference on
Conference_Location
San Jose, CA
Print_ISBN
978-1-4673-1839-6
Type
conf
Filename
6326801
Link To Document