Title :
Surface plasmon polariton Raman microscopy
Author :
Michaels, C.A. ; Yoo, H.W. ; Jung, H.T. ; Richter, L.J.
Author_Institution :
Mater. Meas. Lab., NIST, Gaithersburg, MD, USA
Abstract :
We report surface plasmon polariton (SPP) mediated Raman microscopy on dielectric films in contact with a Ag layer at 785 nm with spatial resolution approaching the optical diffraction limit and reasonable spectral acquisition times.
Keywords :
Raman spectra; dielectric thin films; light diffraction; polaritons; polymer films; silver; surface plasmons; Ag; Raman microscopy; dielectric films; optical diffraction limit; poly(3-hexylthiophene) films; silver layer; spatial resolution; spectral acquisition time; surface plasmon polariton; wavelength 785 nm; Films; Metals; Microscopy; Optical diffraction; Optical microscopy; Plasmons;
Conference_Titel :
Lasers and Electro-Optics (CLEO), 2012 Conference on
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4673-1839-6
