Title :
Built-in system test and fault location
Author :
McLeod, Gordon R.
Author_Institution :
GEC-Marconi Avionics, Edinburgh, UK
Abstract :
In their purest form, BIST, BScan and Scan do not lend themselves to in-service test-compromises and extensions are required. We describe the experience of implementing built-in fault detection and location in a large digital system
Keywords :
application specific integrated circuits; automatic testing; boundary scan testing; built-in self test; data loggers; fault location; integrated circuit testing; military avionics; printed circuit testing; ASIC; ATPG; BIST; BScan; JTAG TAP; PCB test; Scan; boundary scan; built-in fault detection; built-in fault location; built-in system test; fault location; fault logging; in-service test; memory test; microprocessor test; military avionics; scan path control; Aerospace electronics; Application specific integrated circuits; Built-in self-test; Circuit faults; Circuit testing; Fault detection; Fault diagnosis; Fault location; Manufacturing; System testing;
Conference_Titel :
Test Conference, 1994. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-2103-0
DOI :
10.1109/TEST.1994.527962
