Title :
Ion migration in a resistor network
Author :
Singh, P. ; Galyon, G. ; Chu, K. ; Rao, S. ; Larson, H.
Author_Institution :
S/390 Div., Int. Bus. Machines Corp., Poughkeepsie, NY, USA
Abstract :
After a short time in service, resistor networks (R-pacs) in high current regulator circuits experienced decreasing resistance causing some power supplies to latch off. The root cause of the resistance decrease was determined to be ion migration on the R-pac alumina substrate, under the passivation oxide layer. The main corrective action was the replacement of the relatively porous passivation oxide layer with an essentially nonporous and acid resistant passivation oxide layer
Keywords :
circuit reliability; failure analysis; power supplies to apparatus; power supply circuits; resistors; R-pac alumina substrate; corrective action; current regulator circuits; ion migration; passivation oxide layer; power supplies; resistor networks; Glass; Integrated circuit interconnections; Intelligent networks; Passivation; Power supplies; Regulators; Resistors; Silver; Testing; Voltage control;
Conference_Titel :
Applied Power Electronics Conference and Exposition, 1996. APEC '96. Conference Proceedings 1996., Eleventh Annual
Conference_Location :
San Jose, CA
Print_ISBN :
0-7803-3044-7
DOI :
10.1109/APEC.1996.500521
