DocumentCode
1683743
Title
Ion migration in a resistor network
Author
Singh, P. ; Galyon, G. ; Chu, K. ; Rao, S. ; Larson, H.
Author_Institution
S/390 Div., Int. Bus. Machines Corp., Poughkeepsie, NY, USA
Volume
2
fYear
1996
Firstpage
731
Abstract
After a short time in service, resistor networks (R-pacs) in high current regulator circuits experienced decreasing resistance causing some power supplies to latch off. The root cause of the resistance decrease was determined to be ion migration on the R-pac alumina substrate, under the passivation oxide layer. The main corrective action was the replacement of the relatively porous passivation oxide layer with an essentially nonporous and acid resistant passivation oxide layer
Keywords
circuit reliability; failure analysis; power supplies to apparatus; power supply circuits; resistors; R-pac alumina substrate; corrective action; current regulator circuits; ion migration; passivation oxide layer; power supplies; resistor networks; Glass; Integrated circuit interconnections; Intelligent networks; Passivation; Power supplies; Regulators; Resistors; Silver; Testing; Voltage control;
fLanguage
English
Publisher
ieee
Conference_Titel
Applied Power Electronics Conference and Exposition, 1996. APEC '96. Conference Proceedings 1996., Eleventh Annual
Conference_Location
San Jose, CA
Print_ISBN
0-7803-3044-7
Type
conf
DOI
10.1109/APEC.1996.500521
Filename
500521
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