• DocumentCode
    1684308
  • Title

    Investigations into the use of the finite element method and artificial neural networks in the non-destructive analysis of metallic tubes

  • Author

    De Alcantara, Naasson P., Jr. ; De Carvalho, Alexandre M. ; Ulson, José Alfredo C

  • Author_Institution
    Electr. Eng. Dept., UNESP, Bauru, Brazil
  • Volume
    2
  • fYear
    2002
  • fDate
    6/24/1905 12:00:00 AM
  • Firstpage
    1450
  • Lastpage
    1454
  • Abstract
    Presents an investigation into the use of the finite element method and artificial neural networks in the identification of defects in industrial plants´ metallic tubes, due to the aggressive actions of the fluids contained by them and/or atmospheric agents. The methodology used in this study consists of simulating a very large number of defects in a metallic tube, using the finite element method. Both variations in width and height of the defects are considered. Then, the obtained results are used to generate a set of vectors for the training of a multilayer perceptron artificial neural network. Finally, the obtained neural network is used to classify a group of new defects, simulated by the finite element method, but that do not belong to the original data set. The results obtained demonstrate the efficiency of the proposed approach and encourage future works on this subject
  • Keywords
    finite element analysis; flaw detection; learning (artificial intelligence); mechanical engineering computing; metals; multilayer perceptrons; vectors; aggressive fluid actions; artificial neural networks; atmospheric agents; defect classification; defect identification; finite element method; height variations; industrial plants; metallic tubes; multilayer perceptron training; nondestructive analysis; numerical simulation; vectors; width variations; Artificial neural networks; Eddy currents; Finite element methods; Industrial plants; Inspection; Intelligent networks; Multilayer perceptrons; Pipelines; Probes; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Neural Networks, 2002. IJCNN '02. Proceedings of the 2002 International Joint Conference on
  • Conference_Location
    Honolulu, HI
  • ISSN
    1098-7576
  • Print_ISBN
    0-7803-7278-6
  • Type

    conf

  • DOI
    10.1109/IJCNN.2002.1007730
  • Filename
    1007730