• DocumentCode
    1685191
  • Title

    A 130 nm wideband fully differential linear low noise amplifier

  • Author

    Zokaei, Abolfazl ; Amirabadi, Amir ; Ghasemzadeh, Mehdi

  • Author_Institution
    Dept. of Electr. Eng., Islamic Azad Univ., Tehran, Iran
  • fYear
    2015
  • Firstpage
    229
  • Lastpage
    233
  • Abstract
    In this paper, a wide-band fully differential linear low noise amplifier (LNA) in a standard 130nm CMOS process is presented. The LNA utilizes Active Post Distortion (APD) as a voltage combiner that prepares a linear transconductance for enabling harmonic cancellation, which can also mitigate the impedance matching device noise. The impedance matching device is connected to the output transistors to ensure the harmonic cancelation at output node while preserving NF and input return loss at input node. This harmonic cancelation is also APD that guarantees an IIP2 and IIP3 of about 26 dBm and 4 dBm respectively at output node. Operating in a wide bandwidth of about 1.5 GHz from (3.5-5) GHz, the LNA obtains a maximum power gain (S21) of about 14 dB, input reverse isolation (S11) and NF of less than -15 dB and 3.9 dB respectively. From a 1V power supply it dissipates about 21 mW and occupies 0.308 mm2 of chip area.
  • Keywords
    CMOS analogue integrated circuits; differential amplifiers; distortion; harmonics suppression; impedance matching; integrated circuit design; integrated circuit noise; low noise amplifiers; microwave amplifiers; wideband amplifiers; APD; CMOS process; IIP2; IIP3; LNA; active post distortion; frequency 3.5 GHz to 5 GHz; fully differential linear low noise amplifier; harmonic cancellation; impedance matching device noise; input reverse isolation; linear transconductance; power gain; return loss; size 0.308 mm; size 130 nm; voltage combiner; wideband low noise amplifier; Harmonic analysis; Impedance matching; Noise; Noise measurement; Transistors; Wideband; Harmonic Termination; Linearity Improvement; Low Noise Amplifier; Noise Cancelation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Mixed Design of Integrated Circuits & Systems (MIXDES), 2015 22nd International Conference
  • Conference_Location
    Torun
  • Print_ISBN
    978-8-3635-7806-0
  • Type

    conf

  • DOI
    10.1109/MIXDES.2015.7208516
  • Filename
    7208516