• DocumentCode
    1685199
  • Title

    Exhaustive simulation need not require an exponential number of tests

  • Author

    Brand, D.

  • Author_Institution
    IBM, Yorktown Heights, NY, USA
  • fYear
    1992
  • Firstpage
    98
  • Lastpage
    101
  • Abstract
    While simulation is today the most common form of verification, one disadvantage is the excessive number of tests needed for complete coverage. However, the number of tests may be substantially reduced if test case generation is combined with a structural analysis. The resulting set of test cases for exhaustive simulation may be smaller than exponential, which might make exhaustive simulation feasible. Even if the set of test cases is still too large, choosing tests from this reduced set results in better coverage than otherwise.<>
  • Keywords
    circuit analysis computing; digital simulation; logic CAD; logic testing; complete coverage; exhaustive simulation; structural analysis; test case generation; verification; Circuit simulation; Design automation; Logic circuit testing; Simulation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer-Aided Design, 1992. ICCAD-92. Digest of Technical Papers., 1992 IEEE/ACM International Conference on
  • Conference_Location
    Santa Clara, CA, USA
  • Print_ISBN
    0-8186-3010-8
  • Type

    conf

  • DOI
    10.1109/ICCAD.1992.279391
  • Filename
    279391