Title :
Exhaustive simulation need not require an exponential number of tests
Author_Institution :
IBM, Yorktown Heights, NY, USA
Abstract :
While simulation is today the most common form of verification, one disadvantage is the excessive number of tests needed for complete coverage. However, the number of tests may be substantially reduced if test case generation is combined with a structural analysis. The resulting set of test cases for exhaustive simulation may be smaller than exponential, which might make exhaustive simulation feasible. Even if the set of test cases is still too large, choosing tests from this reduced set results in better coverage than otherwise.<>
Keywords :
circuit analysis computing; digital simulation; logic CAD; logic testing; complete coverage; exhaustive simulation; structural analysis; test case generation; verification; Circuit simulation; Design automation; Logic circuit testing; Simulation;
Conference_Titel :
Computer-Aided Design, 1992. ICCAD-92. Digest of Technical Papers., 1992 IEEE/ACM International Conference on
Conference_Location :
Santa Clara, CA, USA
Print_ISBN :
0-8186-3010-8
DOI :
10.1109/ICCAD.1992.279391