DocumentCode :
1685199
Title :
Exhaustive simulation need not require an exponential number of tests
Author :
Brand, D.
Author_Institution :
IBM, Yorktown Heights, NY, USA
fYear :
1992
Firstpage :
98
Lastpage :
101
Abstract :
While simulation is today the most common form of verification, one disadvantage is the excessive number of tests needed for complete coverage. However, the number of tests may be substantially reduced if test case generation is combined with a structural analysis. The resulting set of test cases for exhaustive simulation may be smaller than exponential, which might make exhaustive simulation feasible. Even if the set of test cases is still too large, choosing tests from this reduced set results in better coverage than otherwise.<>
Keywords :
circuit analysis computing; digital simulation; logic CAD; logic testing; complete coverage; exhaustive simulation; structural analysis; test case generation; verification; Circuit simulation; Design automation; Logic circuit testing; Simulation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer-Aided Design, 1992. ICCAD-92. Digest of Technical Papers., 1992 IEEE/ACM International Conference on
Conference_Location :
Santa Clara, CA, USA
Print_ISBN :
0-8186-3010-8
Type :
conf
DOI :
10.1109/ICCAD.1992.279391
Filename :
279391
Link To Document :
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