DocumentCode
1685199
Title
Exhaustive simulation need not require an exponential number of tests
Author
Brand, D.
Author_Institution
IBM, Yorktown Heights, NY, USA
fYear
1992
Firstpage
98
Lastpage
101
Abstract
While simulation is today the most common form of verification, one disadvantage is the excessive number of tests needed for complete coverage. However, the number of tests may be substantially reduced if test case generation is combined with a structural analysis. The resulting set of test cases for exhaustive simulation may be smaller than exponential, which might make exhaustive simulation feasible. Even if the set of test cases is still too large, choosing tests from this reduced set results in better coverage than otherwise.<>
Keywords
circuit analysis computing; digital simulation; logic CAD; logic testing; complete coverage; exhaustive simulation; structural analysis; test case generation; verification; Circuit simulation; Design automation; Logic circuit testing; Simulation;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer-Aided Design, 1992. ICCAD-92. Digest of Technical Papers., 1992 IEEE/ACM International Conference on
Conference_Location
Santa Clara, CA, USA
Print_ISBN
0-8186-3010-8
Type
conf
DOI
10.1109/ICCAD.1992.279391
Filename
279391
Link To Document