Title :
An aging-aware transistor sizing tool regarding BTI and HCD degradation modes
Author :
Hellwege, Nico ; Heidmann, Nils ; Erstling, Marco ; Peters-Drolshagen, Dagmar ; Paul, Steffen
Author_Institution :
Inst. of Electrodynamics & Microelectron. (ITEM.me), Univ. of Bremen, Bremen, Germany
Abstract :
In this paper we present a tool based approach for an aging-aware design method. Extending the gm/ID sizing method by operating point-dependent degradation caused by BTI and HCD enables an innovative design flow. This design flow considers performance characteristics for a fresh circuit and also those of a degraded circuit at design time. Once the degradation from a single transistor is computed, the GMID-Tool does not need any further SPICE or aging simulation. The impact of the change in design methodology is shown for a typical differential amplifier structure.
Keywords :
ageing; circuit stability; differential amplifiers; hot carriers; integrated circuit design; integrated circuit modelling; BTI; GMID-tool; HCD degradation modes; SPICE; aging simulation; aging-aware design method; aging-aware transistor sizing tool; bias temperature instability; design methodology; differential amplifier structure; hot carrier degradation; innovative design flow; point-dependent degradation; Aging; Degradation; Integrated circuit modeling; Mathematical model; Transconductance; Transistors; Aging-aware design; bias temperature instability (BTI); circuit degradation; hot carrier degradation; transconductance efficiency;
Conference_Titel :
Mixed Design of Integrated Circuits & Systems (MIXDES), 2015 22nd International Conference
Conference_Location :
Torun
Print_ISBN :
978-8-3635-7806-0
DOI :
10.1109/MIXDES.2015.7208525
