Title :
Beam profiler for single-photon applications based on compressive sampling techniques
Author :
Earl, Darren ; Evans, Pete ; Grice, W. ; Guo, D.-S. ; Humble, T. ; Martin, Eric ; Pooser, R.
Author_Institution :
Comput. Sci. & Eng. Div., Oak Ridge Nat. Lab., Oak Ridge, TN, USA
Abstract :
We report the development of a low-cost beam characterization technique appropriate for extremely low light levels. The technique makes use of compressive sampling strategies that have been developed recently for imaging applications.
Keywords :
laser beams; photons; quantum optics; beam profiler; compressive sampling techniques; low-cost beam characterization technique; single-photon; Image coding; Image reconstruction; Imaging; Laser beams; Measurement by laser beam; Mirrors; Photonics;
Conference_Titel :
Lasers and Electro-Optics (CLEO), 2012 Conference on
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4673-1839-6
