DocumentCode :
1686041
Title :
Image segmentation method based on particle measurements for charged particle transition analysis in e-paper
Author :
Kim, Seungtaek ; Kim, HyungTae ; Lee, Sangho ; Kim, Jongseok
Author_Institution :
Manuf. Syst. Res. Div., KITECH, CheonAn, South Korea
fYear :
2010
Firstpage :
761
Lastpage :
762
Abstract :
In the e-paper including two differently-charged particle, the direction of the electric field generated from a voltage source make particles move up or down between two parallel electrodes resulting in the black or white cell. The average particle diameter was about 10μm and the gap between the parallel ITO glasses was 50μm. To investigate the particle transition characteristics for each applied voltage, we proposed the image segmentation method to analyze the image taken from the microscope over the e-paper based on the particle measurements, such as particle location, area and shape. Two sample images captured from the microscope at two applied voltages (-250 and +90V DC), were analyzed and their results were also shown in this letter. Experimental results showed that the proposed method can be a good candidate to evaluate the e-paper panel.
Keywords :
electric fields; electrodes; electronic paper; glass; image segmentation; average particle diameter; charged particle transition; e-paper; electric field; image segmentation; microscope; parallel ITO glasses; parallel electrodes; particle measurements; voltage source; Electrodes; Glass; Histograms; Image segmentation; Indium tin oxide; Microscopy; Particle measurements; Image segmentation; charged particles; e-paper; image analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Control Automation and Systems (ICCAS), 2010 International Conference on
Conference_Location :
Gyeonggi-do
Print_ISBN :
978-1-4244-7453-0
Electronic_ISBN :
978-89-93215-02-1
Type :
conf
Filename :
5670289
Link To Document :
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