Title :
Test system of the time-over-threshold based chip optimized for linear transfer characteristics and low power for particle tracking applications
Author :
Kasinski, Krzysztof ; Kleczek, Rafal
Author_Institution :
Dept. of Meas. & Electron., AGH Univ. of Sci. & Technol., Cracow, Poland
Abstract :
This paper presents the circuits and systems developed for testing the DSToTIC3 ASIC. Detailed study of the estimated noise performance in the presence of realistic external components is also a subject of this paper. DSToTIC3 is a prototype, 8-channel front-end electronics designed for the regime of long silicon strip sensors and interconnects of new tracking detectors. Layout and general architecture of the die is presented. Built-in digital-to-analog converters minimize the number of external components required for the chip operation, which makes it easily scalable to a final multichannel design.
Keywords :
application specific integrated circuits; digital-analogue conversion; integrated circuit testing; particle tracks; 8-channel front-end electronics; DSToTIC3 ASIC; built-in digital-to-analog converters; estimated noise performance; final multichannel design; interconnects; long silicon strip sensors; particle tracking applications; time-over-threshold based chip; tracking detectors; Boards; Detectors; Noise; Sensor systems; System-on-chip; Time-over-Threshold; front-end electronics; low-noise; multichannel integrated circuits; radiation imaging;
Conference_Titel :
Mixed Design of Integrated Circuits & Systems (MIXDES), 2015 22nd International Conference
Conference_Location :
Torun
Print_ISBN :
978-8-3635-7806-0
DOI :
10.1109/MIXDES.2015.7208549