• DocumentCode
    1686355
  • Title

    The study of code density histogram testing method to high-speed ADC based on DSP

  • Author

    Xu, Dijian ; Peng, Jun

  • Author_Institution
    Sch. of Electron. Inf. Eng., ChongQing Univ. of Sci. & Technol., Chongqing, China
  • fYear
    2010
  • Firstpage
    2069
  • Lastpage
    2074
  • Abstract
    Code density histogram testing method based on digital signal processor is one of dynamic testing methods of high-speed analog-to digital converters. It can evaluate the performance of high speed ADC accurately and quickly. The theory of Code density histogram testing method is analyzed. A suit of high-speed ADC dynamic testing station based on PC. DSP. and FIFO was built that can be operated easily. Its hardware design and software program were fulfilled and realized dynamic testing using code density histogram testing method to high-speed ADCM80 (S bits). Testing result indicates the dynamic testing station is feasible and operated easily.
  • Keywords
    analogue-digital conversion; digital signal processing chips; dynamic testing; integrated circuit testing; ADC; DSP; analog-to digital converters; code density histogram testing method; digital signal processor; dynamic testing station; hardware design; software program; code density histogram testing; digital signal processing; high-speed ADC;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Intelligent Control and Automation (WCICA), 2010 8th World Congress on
  • Conference_Location
    Jinan
  • Print_ISBN
    978-1-4244-6712-9
  • Type

    conf

  • DOI
    10.1109/WCICA.2010.5554399
  • Filename
    5554399