DocumentCode
1686355
Title
The study of code density histogram testing method to high-speed ADC based on DSP
Author
Xu, Dijian ; Peng, Jun
Author_Institution
Sch. of Electron. Inf. Eng., ChongQing Univ. of Sci. & Technol., Chongqing, China
fYear
2010
Firstpage
2069
Lastpage
2074
Abstract
Code density histogram testing method based on digital signal processor is one of dynamic testing methods of high-speed analog-to digital converters. It can evaluate the performance of high speed ADC accurately and quickly. The theory of Code density histogram testing method is analyzed. A suit of high-speed ADC dynamic testing station based on PC. DSP. and FIFO was built that can be operated easily. Its hardware design and software program were fulfilled and realized dynamic testing using code density histogram testing method to high-speed ADCM80 (S bits). Testing result indicates the dynamic testing station is feasible and operated easily.
Keywords
analogue-digital conversion; digital signal processing chips; dynamic testing; integrated circuit testing; ADC; DSP; analog-to digital converters; code density histogram testing method; digital signal processor; dynamic testing station; hardware design; software program; code density histogram testing; digital signal processing; high-speed ADC;
fLanguage
English
Publisher
ieee
Conference_Titel
Intelligent Control and Automation (WCICA), 2010 8th World Congress on
Conference_Location
Jinan
Print_ISBN
978-1-4244-6712-9
Type
conf
DOI
10.1109/WCICA.2010.5554399
Filename
5554399
Link To Document