Title :
A novel microstrip UWB bandpass filter using stub-loaded multiple-mode resonator
Author :
Di Kai Liu ; Chen Fei Su ; Xue Yan Wang
Author_Institution :
Sch. of Phys. Electron., Univ. of Electron. Sci. & Technol. of China, Chengdu, China
Abstract :
A novel microstrip ultra-wideband (UWB) band-pass filter (BPF) using stub-loaded multiple-mode resonator (MMR) is presented in this paper. The MMR is constructed by loading three open stubs in a uniform-impedance resonator, i.e., one uniform-impedance stub loaded at the center and two stepped-impedance stubs loaded at the symmetrical side locations. Four modes, including two odd modes (fodd1 and fodd2) and two even modes (feven1 and feven2), could be tuned in the desired band, and two transmission zeros are created near the cutoff frequencies by the open stubs and two interdigital coupling feeding lines, leading to the pass-band selectivity greatly. The paper shows modal resonant frequencies against the open-stub-loaded parameters at the center, which can control the even modes flexibly, while the odd modes remain the same. A compact planar UWB BPF is simulated. The simulated results show good band-pass filtering performance and sharp selectivity.
Keywords :
band-pass filters; microstrip filters; resonator filters; ultra wideband technology; MMR; compact planar UWB BPF; even modes; interdigital coupling feeding lines; microstrip UWB bandpass filter; microstrip ultrawideband band-pass filter; modal resonant frequency; odd modes; one uniform-impedance stub; open-stub-loaded parameters; pass-band selectivity; stepped-impedance stubs; stub-loaded multiple-mode resonator; symmetrical side locations; transmission zeros; uniform-impedance resonator; Band-pass filters; Filtering theory; Microwave FET integrated circuits; Microwave filters; Microwave integrated circuits; Resonant frequency; Resonator filters; bandpass filter (BPF); multiple-mode resonator(MMR); ultra-wideband (UWB);
Conference_Titel :
Applied Superconductivity and Electromagnetic Devices (ASEMD), 2013 IEEE International Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4799-0068-8
DOI :
10.1109/ASEMD.2013.6780729