DocumentCode
1686647
Title
Artificial neural network model for HEMTs constructed from large-signal time-domain measurements
Author
Schreurs, D.M.M.-P. ; Jargon, J.A. ; Remley, K.A. ; DeGroot, D.C. ; Gupta, K.C.
Author_Institution
Div. ESAT-TELEMIC, K.U.Leuven, Leuven, Belgium
fYear
2002
Abstract
A methodology to construct behavioural models for microwave devices from time-domain large-signal measurements has been modified by using artificial neural networks (ANNs) for the multivariate fitting functions instead of polynomials. The behavioural models for the class of devices (microwave transistors) considered can be defined by expressing the terminal currents as functions of the state variables, the embedded voltages. In this work, we show that ANNs are valuable candidates to represent these relationships. They outperform models based on multivariate polynomials, because they can better model the typical physical characteristics of the devices considered. Experimental results are quantitatively confirmed by using comparison metrics.
Keywords
high electron mobility transistors; microwave field effect transistors; neural nets; semiconductor device models; time-domain analysis; artificial neural network model; behavioural models; embedded voltages; high electron mobility transistors; large-signal time-domain measurements; microwave devices; microwave transistors; multivariate fitting functions; multivariate polynomials; terminal currents; Artificial neural networks; HEMTs; MODFETs; Microwave devices; Microwave measurements; Microwave theory and techniques; Microwave transistors; Polynomials; Time domain analysis; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
ARFTG Conference Digest, Spring 2002. 59th
Conference_Location
Seattle, WA
Print_ISBN
0-7803-7143-7
Type
conf
DOI
10.1109/ARFTGS.2002.1214677
Filename
1214677
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